Tech Exchange on AFM with Neno Vision

In this episode of the Tech Exchange we look at the correlation of Atomic Force Microscopy (AFM) with Scanning Electron Microscopy (SEM).

Pavel Komarov from NenoVision will present on “LiteScope 2.5 – The next step in the AFM-in-SEM analysis”.

The LiteScope is a new generation of “plug & play” atomic force microscopy (AFM) microscope that can be easily integrated into a scanning electron microscopy (SEM) system for correlative multimodal sample analysis. This microscope offers several unique features, making it an excellent tool for in-situ sample characterization and precise localization of regions of interest.

Firstly, the microscope offers correlative multimodal sample analysis by combining the high-resolution imaging capabilities of AFM (and 12 more related techniques) with the capabilities of SEM material analysis. This combination allows for a more comprehensive understanding of a sample’s properties, leading to better insights into its structure and behaviour.

Secondly, it enables in-situ sample characterization, allowing researchers to analyze samples under laboratory-controlled conditions, including temperature and humidity. This capability is crucial for research on oxidation-sensitive samples, whereas LiteScope offers a way to prepare and measure the sample without the need to take the sample out of a vacuum.

Finally, LiteScope provides precise localization of the region of interest, enabling researchers to target specific areas of a sample with high accuracy. This feature is handy in analyzing complex samples, where it can be difficult to isolate specific regions of interest.